Jakubowicz, Abram: search on Z-Library

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1

SEM/EBIC characterization of degradation at mirrors of GaAs/AlGaAs laser diodes

Abram Jakubowicz, Albert Oosenbrug

Journal:

Microelectronic Engineering

Year:

1994

Language:

english

File:

PDF, 511 KB

english, 1994

2

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] In-Plane Semiconductor Lasers III - High-brightness broad-area lasers with high reliability for Yb-Er-fiber pumping applications

Mohrdiek, Stefan, Brovelli, Luigi R., Burkard, Manfred, Harder, Christoph S., Jakubowicz, Abram, Patrick, William, Williams, Erica J., Oosenbrug, Albert, Choi, Hong K., Zory, Peter S.

Year:

1999

Language:

english

File:

PDF, 289 KB

english, 1999

3

Electric-field-induced room-temperature doping in CuInSe2

Abram Jakubowicz, Geula Dagan, Claus Schmitz, David Cahen

Journal:

Advanced Materials

Year:

1992

Language:

english

File:

PDF, 609 KB

english, 1992

4

Aggregate structure in CuBSe2/Mo films (B=In,Ga): Its relation to their electrical activity

Margulis, Lev, Hodes, Gary, Jakubowicz, Abram, Cahen, David

Journal:

Journal of Applied Physics

Year:

1989

Language:

english

File:

PDF, 1.05 MB

english, 1989

5

Junction electroluminescence from microscopic diode structures in CuInSe2, prepared by electric field-assisted doping

Leonid Chernyak, Dr. Abram Jakubowicz, Prof. David Cahen

Journal:

Advanced Materials

Year:

1995

Language:

english

File:

PDF, 473 KB

english, 1995

6

SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Fabrication, Testing, and Reliability of Semiconductor Lasers II - Operational stability of 980-nm pump lasers at 200 mW and above

Oosenbrug, Albert, Jakubowicz, Abram, Fallahi, Mahmoud, Wang, S. C.

Year:

1997

Language:

english

File:

PDF, 501 KB

english, 1997

7

SPIE Proceedings [SPIE Metal/Nonmetal Microsystems: Physics, Technology, and Applications - Polanica Zdroj, Poland (Monday 11 September 1995)] Metal/Nonmetal Microsystems: Physics, Technology, and Applications - Microcharacterization of semiconductor laser diodes: materials and devices

Jakubowicz, Abram, Licznerski, Benedykt W., Dziedzic, Andrzej

Year:

1996

Language:

english

File:

PDF, 375 KB

english, 1996

8

Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors

Holodnik, Barbara, Jakubowicz, Abram, Lukaszewicz, Marian, Hauffe, Wolfgang

Journal:

Active and Passive Electronic Components

Year:

1986

Language:

english

File:

PDF, 8.08 MB

english, 1986

9

SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors - Temperature dependence of electron beam induced current and cathodoluminescence contrast of dislocations in GaAs

Eckstein, Michael, Jakubowicz, Abram, Bode, Michael, Habermeier, Hanns-Ulrich, Craighead, Harold G., Gibson, J. M.

Year:

1990

Language:

english

File:

PDF, 319 KB

english, 1990

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